Gomes HL, Medeiros MCR, Villani F, Canudo J, Loffredo F, Miscioscia R, Martinez-Domingo C, Ramon E, Sowade E, Mitra KY, Baumann RR, McCulloch I, et alJuly 2015Journal article Journal:Microelectronics ReliabilityVolume:55Issue:8, Elsevier, pp.1192 - 1195No abstract availableKeywords:40 Engineering , 4016 Materials Engineering , 4018 Nanotechnology DOI10.1016/j.microrel.2015.05.006